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Home > Magnetic Sensors > Hall Element > Reliability Test Terms for Hall elements
Reliability Test Terms for Hall elements
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HW-series
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Test |
N |
Conditions |
Standard |
Time |
High Humidity Storage Test
|
22 |
Ta = 85°C, RH = 85% |
Within +-20% of the initial value.
Note; | Vos |<=(Upper standard limit +5mV) |
1000hrs |
High Temperature Bias Test |
22 |
Ta=110°C Ic is the bias current |
Same as above |
1000hrs |
Heat-Proof Test for Soldering
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22 |
Dipped in the 260+-5°C
solder up to the 1mm part from the body. |
Same as above |
10+-1sec |
High Temperature Storage Test |
22 |
Ta=125°C |
Same as above |
1000hrs |
Heat Cycles Test
|
22 |
| -40°C |
=>> |
Room
Temperature |
=>> |
+125°C |
| 30min |
<<= |
5min |
<<= |
30min |
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Same as above |
50 cycles |
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HG,HZ,HQ-series
|
Test Item |
N |
Test Condition |
Standard |
Test Time |
High Humidity Storage Test
|
22 |
Ta=85°C, RH = 85% |
Within +-20% of the initial value.
Note; | Vos |<=(Upper standard limit +5mV) |
1000hrs |
High Temperature Bias Test |
22 |
Ta=125°C
Ic is the bias current |
Same as above |
1000hrs |
Heat-Proof Test for Soldering |
22 |
Dipped in the 300+-5°C
solder up to the 1mm part from the body. |
Same as above |
5+-2 sec |
High Temperature Storage Test |
22 |
Ta=150°C |
Same as above |
1000hrs |
Heat Cycles Test
|
22 |
| -55°C |
=>> |
Room Temperature |
=>> |
+150°C |
| 30min |
<<= |
5min |
<<= |
30min |
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Same as above |
50 cycles |
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